eprintid: 1472 rev_number: 8 eprint_status: archive userid: 6 dir: disk0/00/00/14/72 datestamp: 2013-02-13 07:46:55 lastmod: 2013-02-13 07:46:55 status_changed: 2013-02-13 07:46:55 type: book_section metadata_visibility: show creators_name: Rubagotti, Matteo creators_name: Zaccarian, Luca creators_name: Bemporad, Alberto creators_id: creators_id: creators_id: alberto.bemporad@imtlucca.it title: Stability analysis of discrete-time piecewise-affine systems over non-invariant domains ispublished: pub subjects: QA75 subjects: TJ divisions: EIC full_text_status: none keywords: Closed loop systems; Control theory; Lyapunov methods; Reachability analysis; Stability analysis; Vectors; Xenon note: 51st IEEE Conference on Decision and Control December 10-13, 2012. Maui, Hawaii, USA abstract: This paper analyzes stability of discrete-time piecewise-affine systems defined on non-invariant domains. An algorithm based on linear programming is proposed, in order to prove the exponential stability of the origin and to find a positively invariant estimate of the region of attraction. The theoretical results are based on the definition of a piecewise-affine, possibly discontinuous, Lyapunov function. The proposed method presents a relatively low computational burden, and is proven to lead to feasible solutions in a broader range of cases with respect to a previously proposed approach. date: 2012-12 date_type: published publisher: IEEE pagerange: 4235 -4240 event_title: Decision and Control (CDC), 2012 IEEE 51st Annual Conference on id_number: 10.1109/CDC.2012.6426761 refereed: TRUE isbn: 978-1-4673-2064-1 book_title: Proceedings of the IEEE 51st Annual Conference on Decision and Control (CDC), 2012 official_url: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6426761&isnumber=6425800 citation: Rubagotti, Matteo and Zaccarian, Luca and Bemporad, Alberto Stability analysis of discrete-time piecewise-affine systems over non-invariant domains. In: Proceedings of the IEEE 51st Annual Conference on Decision and Control (CDC), 2012. IEEE, 4235 -4240. ISBN 978-1-4673-2064-1 (2012)