TY  - JOUR
AV  - none
TI  - Electrical recovery and fatigue degradation phenomena in cracked silicon cells
Y1  - 2014/07/26/
UR  - http://www.nscj.co.uk/JECM/PDF/1-1-4-Marco%20Paggi.pdf
JF  - Journal of Energy Challenges and Mechanics
IS  - 1
A1  - Paggi, Marco
A1  - Berardone, Irene
A1  - Infuso, Andrea
A1  - Corrado, Mauro
SN  - 2056-9386
PB  - North Sea Conference & Journals
N2  - An experimental study based on the electroluminescence technique is herein proposed to demonstrate the existence of coupling between mechanical deformations and the intensity of the electric field due to cracks in monocrystalline Silicon cells embedded in photovoltaic modules. In spite of the very brittle nature of Silicon, due to the action of the encapsulating polymer and residual compressive stresses resulting from the lamination stage, cracks experience crack closure and contact during mechanical unloading, partially recovering their original electric response. Crack propagation in case of cyclic loading, as, e.g., in case of vibrations due to transportation and use, have also been reported for the very first time. The research results pinpoint the need of improving electric predictions based on the estimation of inactive cell areas, since worst case scenarios not accounting for electro-mechanical coupling are too conservative.
SP  - 1
ID  - eprints2248
EP  - 5
VL  - 1
ER  -