TY  - JOUR
EP  - 5
ID  - eprints2248
N2  - An experimental study based on the electroluminescence technique is herein proposed to demonstrate the existence of coupling between mechanical deformations and the intensity of the electric field due to cracks in monocrystalline Silicon cells embedded in photovoltaic modules. In spite of the very brittle nature of Silicon, due to the action of the encapsulating polymer and residual compressive stresses resulting from the lamination stage, cracks experience crack closure and contact during mechanical unloading, partially recovering their original electric response. Crack propagation in case of cyclic loading, as, e.g., in case of vibrations due to transportation and use, have also been reported for the very first time. The research results pinpoint the need of improving electric predictions based on the estimation of inactive cell areas, since worst case scenarios not accounting for electro-mechanical coupling are too conservative.
SP  - 1
TI  - Electrical recovery and fatigue degradation phenomena in cracked silicon cells
AV  - none
SN  - 2056-9386
IS  - 1
Y1  - 2014/07/26/
JF  - Journal of Energy Challenges and Mechanics
UR  - http://www.nscj.co.uk/JECM/PDF/1-1-4-Marco%20Paggi.pdf
A1  - Paggi, Marco
A1  - Berardone, Irene
A1  - Infuso, Andrea
A1  - Corrado, Mauro
VL  - 1
PB  - North Sea Conference & Journals
ER  -