TY  - JOUR
JF  - Energy Procedia
ID  - eprints2287
UR  - http://dx.doi.org/10.1016/j.egypro.2014.08.005
EP  - 29
PB  - Elsevier
SP  - 22
AV  - public
SN  - 1876-6102
Y1  - 2014///
N2  - Damage, micro-cracks, grain boundaries and other defects in solar cells are impacting on the electric power-loss of photovoltaic modules, their actual solar conversion efficiency and also their lifetime. In the present contribution, a one-dimensional model for simulating the electric current distribution in solar cells accounting for a distributed series resistance is generalized to the presence of partially conductive cracks. The proposed model is used to perform a quantitative analysis of electroluminescence (EL) images of cracked monocrystalline silicon solar cells. A further generalization in a stochastic direction is also proposed in order to take into account randomly distributed defects typical of polycrystalline silicon.
TI  - A generalized electric model for mono and polycrystalline silicon in the presence of cracks and random defects
VL  - 55
A1  - Berardone, Irene
A1  - Corrado, Mauro
A1  - Paggi, Marco
ER  -