eprintid: 2439
rev_number: 10
eprint_status: archive
userid: 6
dir: disk0/00/00/24/39
datestamp: 2015-03-26 11:36:44
lastmod: 2015-03-26 11:36:44
status_changed: 2015-03-26 11:36:44
type: book_section
metadata_visibility: show
creators_name: Cerone, Vito
creators_name: Piga, Dario
creators_name: Regruto, Diego
creators_id: 
creators_id: dario.piga@imtlucca.it
creators_id: 
title: Set-membership EIV identification through LMI relaxation techniques
ispublished: pub
subjects: QA75
divisions: CSA
full_text_status: public
keywords: LMI relaxation, Set-membership identification, errors-invariables
note: 2010 American Control Conference, held in Marriott Waterfront (USA), June 30-July 02, 2010
abstract: In this paper the Set-membership Error-In-Variables (EIV) identification problem is considered, that is the identification of linear dynamic systems when both the output and the input measurements are corrupted by bounded noise. A new approach for the computation of the Parameters Uncertainty Intervals (PUIs) is discussed. First the problem is formulated in terms of non-convex semi-algebraic optimization. Then, a Linear-Matrix-Inequalities relaxation technique is presented to compute parameters bounds by means of convex optimization. Finally, convergence properties and computational complexity of the given algorithms are discussed. Advantages of the proposed technique with respect to previously published ones are discussed both theoretically and by means of a simulated example.
date: 2010-06
date_type: published
publisher: IEEE
pagerange: 2158-2163
event_title: American Control Conference (ACC), 2010
id_number: 10.1109/ACC.2010.5531327
refereed: TRUE
isbn: 978-1-4244-7426-4
book_title: Proceedings of American Control Conference (ACC), 2010
official_url: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5531327&isnumber=5530425
citation:   Cerone, Vito and Piga, Dario and Regruto, Diego  Set-membership EIV identification through LMI relaxation techniques.   In:  Proceedings of American Control Conference (ACC), 2010.   IEEE, pp. 2158-2163.  ISBN 978-1-4244-7426-4      (2010)  
document_url: http://eprints.imtlucca.it/2439/1/ACC2010Preprint_piga.pdf