%P 1358-1371
%T Workload Change Point Detection for Runtime Thermal Management of Embedded Systems
%I IEEE
%V 35
%O SCOPUS ID: 2-s2.0-84979539453; WOS Accession Number: WOS:000380061700011
%X Applications executed on multicore embedded systems interact with system software [such as the operating system (OS)] and hardware, leading to widely varying thermal profiles which accelerate some aging mechanisms, reducing the lifetime reliability. Effectively managing the temperature therefore requires: 1) autonomous detection of changes in application workload and 2) appropriate selection of control levers to manage thermal profiles of these workloads. In this paper, we propose a technique for workload change detection using density ratio-based statistical divergence between overlapping sliding windows of CPU performance statistics. This is integrated in a runtime approach for thermal management, which uses reinforcement learning to select workload-specific thermal control levers by sampling on-board thermal sensors. Identified control levers override the OSs native thread allocation decision and scale hardware voltage-frequency to improve average temperature, peak temperature, and thermal cycling. The proposed approach is validated through its implementation as a hierarchical runtime manager for Linux, with heuristic-based thread affinity selected from the upper hierarchy to reduce thermal cycling and learningbased voltage-frequency selected from the lower hierarchy to reduce average and peak temperatures. Experiments conducted with mobile, embedded, and high performance applications on ARM-based embedded systems demonstrate that the proposed approach increases workload change detection accuracy by an average 3.4?, reducing the average temperature by 4 ?C-25 ?C, peak temperature by 6 ?C-24 ?C, and thermal cycling by 7%-35% over state-of-the-art approaches.
%L eprints3573
%D 2016
%K Embedded systems, Hardware, Thermal management, Temperature dependence, Central Processing Unit, Voltage control, Thermal stresses
%A Anup Das
%A Geoff V. Merrett
%A Mirco Tribastone
%A Bashir M. Al-Hashimi
%N 8
%J IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
%R doi:10.1109/TCAD.2015.2504875