eprintid: 570
rev_number: 13
eprint_status: archive
userid: 7
dir: disk0/00/00/05/70
datestamp: 2011-07-27 09:16:26
lastmod: 2014-07-17 12:19:29
status_changed: 2011-07-27 09:16:26
type: book_section
metadata_visibility: show
item_issues_count: 0
creators_name: Bemporad, Alberto
creators_name: Giovanardi, L.
creators_name: Torrisi, Fabio Danilo
creators_id: alberto.bemporad@imtlucca.it
creators_id: 
creators_id: 
title: Robust simulation of nonlinear electronic circuits
ispublished: pub
subjects: QA
subjects: QA75
subjects: TK
divisions: CSA
full_text_status: none
abstract: This paper proposes robust simulation of piecewise linear systems as a tool for the analysis of nonlinear electronic circuits. Rather than computing the evolution of a single trajectory, robust simulation computes the evolution from a set of initial conditions in the state space, for all forcing input signals within a given class. We describe here a tool to perform this analysis using mathematical programming. Among various applications, the tool allows to estimate the domain of attraction of equilibria, and to
determine if some design speci£cations — expressed
themselves in terms of reachability of subsets of the
state-space — are met. A test of the tool on Chua’s
circuit is presented.
date: 2000
date_type: published
publication: Proceedings of the 8th IEEE International Workshop on Nonlinear Dynamics of Electronic Systems
publisher: World Scientific Publishing
place_of_pub: Singapore
pagerange: 131-135
event_dates: Catania, Italy
refereed: TRUE
isbn: 9789810243418
book_title: Nonlinear dynamics of electronic systems : proceedings of the IEEE workshop
editors_name: Setti, Gianluca
editors_name: Rovatti, Riccardo
editors_name: Mazzini, Gianluca
related_url_url: http://www.worldscibooks.com/chaos/4453.html
related_url_type: pub
citation:   Bemporad, Alberto and Giovanardi, L. and Torrisi, Fabio Danilo  Robust simulation of nonlinear electronic circuits.   In:  Nonlinear dynamics of electronic systems : proceedings of the IEEE workshop.   World Scientific Publishing, Singapore, pp. 131-135.  ISBN 9789810243418      (2000)