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Electrical recovery and fatigue degradation phenomena in cracked silicon cells

Paggi, Marco and Berardone, Irene and Infuso, Andrea and Corrado, Mauro Electrical recovery and fatigue degradation phenomena in cracked silicon cells. Journal of Energy Challenges and Mechanics, 1 (1). pp. 1-5. ISSN 2056-9386 (2014)

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An experimental study based on the electroluminescence technique is herein proposed to demonstrate the existence of coupling between mechanical deformations and the intensity of the electric field due to cracks in monocrystalline Silicon cells embedded in photovoltaic modules. In spite of the very brittle nature of Silicon, due to the action of the encapsulating polymer and residual compressive stresses resulting from the lamination stage, cracks experience crack closure and contact during mechanical unloading, partially recovering their original electric response. Crack propagation in case of cyclic loading, as, e.g., in case of vibrations due to transportation and use, have also been reported for the very first time. The research results pinpoint the need of improving electric predictions based on the estimation of inactive cell areas, since worst case scenarios not accounting for electro-mechanical coupling are too conservative.

Item Type: Article
Projects: ERC StG CA2PVM (GA no. 306622)
Funders: European Research Council
Subjects: Q Science > Q Science (General)
Research Area: Computer Science and Applications
Depositing User: Prof Marco Paggi
Date Deposited: 02 Oct 2014 09:29
Last Modified: 02 Oct 2014 09:29
URI: http://eprints.imtlucca.it/id/eprint/2248

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