Berardone, Irene and Corrado, Mauro and Paggi, Marco A generalized electric model for mono and polycrystalline silicon in the presence of cracks and random defects. Energy Procedia, 55. pp. 22-29. ISSN 1876-6102 (2014)
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Abstract
Damage, micro-cracks, grain boundaries and other defects in solar cells are impacting on the electric power-loss of photovoltaic modules, their actual solar conversion efficiency and also their lifetime. In the present contribution, a one-dimensional model for simulating the electric current distribution in solar cells accounting for a distributed series resistance is generalized to the presence of partially conductive cracks. The proposed model is used to perform a quantitative analysis of electroluminescence (EL) images of cracked monocrystalline silicon solar cells. A further generalization in a stochastic direction is also proposed in order to take into account randomly distributed defects typical of polycrystalline silicon.
| Item Type: | Article |
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| Identification Number: | 10.1016/j.egypro.2014.08.005 |
| Projects: | ERC StG CA2PVM (GA no. 306622), FIRB RBFR107AKG |
| Funders: | European Research Council, Italian Ministry of Education, University and Research |
| Subjects: | Q Science > Q Science (General) |
| Research Area: | Computer Science and Applications |
| Depositing User: | Prof Marco Paggi |
| Date Deposited: | 02 Oct 2014 08:53 |
| Last Modified: | 02 Oct 2014 08:53 |
| URI: | http://eprints.imtlucca.it/id/eprint/2287 |
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