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The effect of contact on the decohesion of laminated beams with multiple microcracks

Carpinteri, Alberto and Paggi, Marco and Zavarise, Giorgio The effect of contact on the decohesion of laminated beams with multiple microcracks. International Journal of Solids and Structures, 45 (1). 129 - 143. ISSN 0020-7683 (2008)

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The problem of interface decohesion in laminated beams is addressed with reference to the debonding double cantilever beam test geometry (DCB). The paper deals with the analysis of the influence of nonuniform bonding properties or interfacial defects on the crack propagation process and its stability. To this aim, the classical analytical approach based on the Euler–Bernoulli beam on an elastic foundation is extended to the presence of a general distribution of microcracks ahead of the macrocrack tip. The main features and limitations of this approach are carefully analyzed. In particular, it is shown that this simplified approach does not consider the unilateral contact condition along the interface, thus admitting a penetration between the two arms of the beam. A comparison with a finite element formulation is proposed to assess if this violation of the constraints inequalities, usually adopted in the case of uniform bonding, is still acceptable when interfacial defects are present. In order to fully describe the whole nonlinear behavior of the interface, a generalized interface constitutive law is used. The models comparison shows that, in the presence of interfacial defects, the effect of contact plays a crucial role in the description of the mechanical response of the joint.

Item Type: Article
Identification Number: 10.1016/j.ijsolstr.2007.07.012
Uncontrolled Keywords: Interfaces; Decohesion; Contact mechanics; Cohesive models; Finite elements
Subjects: T Technology > TJ Mechanical engineering and machinery
Research Area: Computer Science and Applications
Depositing User: Prof Marco Paggi
Date Deposited: 28 Nov 2013 14:52
Last Modified: 09 Oct 2014 09:20
URI: http://eprints.imtlucca.it/id/eprint/1965

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